Research
Techniques
Secondary Ion Mass Spectrometry
Secondary ion mass spectrometry, using primary ions (Au or Bi, 25 keV), sputters a surface of solid sample generating secondary species. The secondary ions are determined in time-of-flight analyzer providing excellent sensitivity (up to ppb), additionally with two dimensional imaging (100 nm resolution) and three dimensional depth profile (sub-nanometer). Moreover, Cr:forsterite femtosecond laser (1240 nm wavelength) postionization, increasing sensitivity and quantification, is integrated with a pulse shaper to perform an adaptive control of the mass spectra, as a state-of-the-art enhanced detection.