Research
Techniques
Scanning Probe Microscopy (AFM, STM, and SNOM) and SEM
A category of scanning probe microscopes is represented by atomic force microscopy, scanning tunneling microscopy, and scanning near-field optical microscopy. Scanning electron microscopy is a standard tool of the high resolution microscopy. The atomic force microscopy provides air scans of dry or liquid surface samples in contact or non-contact modes with images of topography or phase. The scanning tunneling microscopy is air operated only, providing tunneling current measurement. The scanning near-field optical microscopy utilizes optical fiber to deliver near-field electromagnetic evanescent field to excite the surface, which is then mapped in transmission or reflection modes.